The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2022

Filed:

Apr. 05, 2018
Applicant:

Universitetet I Tromsø-norges Arktiske Universitet, Tromso, NO;

Inventors:

Balpreet Singh Ahluwalia, Tromso, NO;

Thomas R. Huser, Werther, DE;

Olav Gaute Hellesø, Kvaloya, NO;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01); G02B 21/00 (2006.01); G01N 21/64 (2006.01); G02B 27/10 (2006.01); G02B 27/58 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0032 (2013.01); G01N 21/6458 (2013.01); G02B 27/10 (2013.01); G02B 27/58 (2013.01); G01N 2201/06 (2013.01); G01N 2201/0635 (2013.01); G01N 2201/06113 (2013.01); G01N 2201/08 (2013.01); G01N 2201/108 (2013.01);
Abstract

An optical component for illuminating a sample region with a periodic light pattern comprises: a first waveguide, a further waveguide and an optical splitter. The optical splitter has an input for receiving light, a first output and a second output. The first waveguide is optically coupled to the first output, to direct the first input light into the sample region in a first direction. The second output is optically coupled to the sample region to direct second input light into the sample region in a second direction. The further waveguide is arranged to receive third input light which is directed into the sample region in a third direction. The first direction, second direction and third direction are different from one another. The first and second input light interferes to form a periodic pattern in the sample region. The optical component may be used for structured illumination microscopy.


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