The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2022

Filed:

Sep. 22, 2020
Applicant:

Landmark Graphics Corporation, Houston, TX (US);

Inventor:

Xuan Nam Nguyen, Katy, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/30 (2006.01);
U.S. Cl.
CPC ...
G01V 1/307 (2013.01); G01V 2210/20 (2013.01); G01V 2210/63 (2013.01);
Abstract

Systems and methods are provided for a horizon patch extraction process and in particular, to receiving seismic trace data of a plurality of seismic events of a subterranean volume, selecting a first seismic trace based on the seismic trace data of the plurality of seismic events, the first seismic trace including a plurality of seismic onsets, determining a depth, an amplitude, and a first thickness of a first seismic onset of the first seismic trace, determining a second thickness between the first seismic onset and a second seismic onset, determining a third thickness between the first seismic onset and a third seismic onset, and generating a horizon patch based on the depth, the amplitude, and the first thickness of the first seismic onset, the second thickness between the first seismic onset and the second seismic onset, and the third thickness between the first seismic onset and the third seismic onset.


Find Patent Forward Citations

Nguyen, Xuan. (2022). Automated extraction of horizon patches from seismic data (U.S. Patent No. 11454734). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11454734

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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