The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2022

Filed:

Sep. 11, 2019
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Minoru Nakamura, Yamanashi, JP;

Atsushi Watanabe, Yamanashi, JP;

Yuuki Takahashi, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/89 (2020.01); G01S 17/36 (2006.01); G01S 7/487 (2006.01);
U.S. Cl.
CPC ...
G01S 17/89 (2013.01); G01S 17/36 (2013.01); G01S 7/487 (2013.01);
Abstract

An object monitoring system includes means for calculating an arrangement of an external object in a target space based on a distance measurement value of the external object, and estimating a shift amount of the distance measurement value caused by the external object in accordance with the calculated arrangement, and means for correcting, based on the estimated shift amount, determination of whether or not a monitored object is present in a monitoring area set in the target space.


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