The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2022

Filed:

Mar. 05, 2018
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Falk Uhlemann, Hamburg, DE;

Graham Michael Place, Gainesville, FL (US);

Ingmar Graesslin, Boenningstedt, DE;

Christian Findeklee, Norderstedt, DE;

Oliver Lips, Hamburg, DE;

Cornelis Jacobus Hendrikus Blom, Lepelstraat, NL;

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G01R 33/36 (2006.01); G01R 33/54 (2006.01);
U.S. Cl.
CPC ...
G01R 33/36 (2013.01); G01R 33/54 (2013.01); G06F 11/079 (2013.01); G06F 11/0733 (2013.01); G06F 11/0766 (2013.01);
Abstract

When predicting required component service in an imaging device such as a magnetic resonance (MR) imaging device (), component parameters such as coil voltage, phase lock lost (PLL) events, etc. are sampled to monitor system components. Voltage samples are filtered according to their temporal proximity to coil plug-in and unplug events to generate a filtered data set that is analyzed by a processor () to determine whether to transmit a fault report. A service recommendation is received based on the transmitted report and includes a root cause diagnosis and service recommendation that is output to a user interface ().


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