The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2022

Filed:

Jun. 06, 2022
Applicant:

Beijing University of Aeronautics and Astronautics, Beijing, CN;

Inventors:

Jie Tian, Beijing, CN;

Yimeng Li, Beijing, CN;

Yu An, Beijing, CN;

Jing Zhong, Beijing, CN;

Haoran Zhang, Beijing, CN;

Yanjun Liu, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/12 (2006.01);
U.S. Cl.
CPC ...
G01R 33/1276 (2013.01);
Abstract

A magnetic particle imaging method based on a non-ideal Field Free Point (FFP), including the following steps: setting external magnetic field conditions of a non-ideal FFP and an ideal FFP, and obtaining a magnetization vector M of Superparamagnetic Iron Oxide Nanoparticles (SPIOs) and a Point Spread Function (PSF) in combination with a Langevin function; obtaining a signal feature on basis of a voltage signal of a detection coil of a Magnetic Particle Imaging (MPI) instrument; performing integral transformation on the voltage signal collected by the detection coil of the MPI instrument to obtain a voltage signal of an equivalent ideal FFP; averaging the moving speed of an FFP of the MPI instrument to obtain a moving speed of the equivalent ideal FFP; obtaining an equivalent Three-Dimensional concentration reconstruction image on basis of the voltage signal of the equivalent ideal FFP and a moving speed of the equivalent ideal FFP.


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