The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2022

Filed:

Jul. 26, 2019
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

William Joshua Bush, Sunnyvale, CA (US);

Neeraj Bhardwaj, Bangalore, IN;

Erfan Shirazian, Fort Worth, TX (US);

Madhusudan Sampath, Bangalore, IN;

Pavinkumar Ramasamy, Bangalore, IN;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01);
U.S. Cl.
CPC ...
G01R 31/287 (2013.01); G01R 1/06705 (2013.01); G01R 1/07364 (2013.01); G01R 31/2886 (2013.01); G01R 31/2887 (2013.01); G01R 31/2893 (2013.01);
Abstract

A nontransitory computer-readable program storage medium storing program instructions. The program, when executed by a processor, has the processor capable of receiving a set of input data, the input data relating to devices on a test board for testing a device under test. The program, when executed by a processor, also is capable of transforming the set of input data into test board mapping data. The test board mapping data comprises an ordered listing of potential test points along a path that couples to a conductive surface, wherein the potential test points are derived from at least one of the test board attributes. Further, the program, when executed by a processor, is capable of identifying a selected test point from among the one or more potential test points, the selected test point for spike check probing of the device under test.


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