logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11454618 B1

PDFFull Text
Date of Patent:
Sep. 27, 2022

Filed:

Jul. 09, 2019

Coupled analytical instruments for dual mode ftir/gc-ftir

Applicant:

Mls Acq, Inc., East Windsor, CT (US);

Inventors:

Martin L. Spartz, Ellington, CT (US);

Anthony S. Bonanno, Ellington, CT (US);

Peter P. Behnke, Vernon, CT (US);

Assignee:

MLS ACQ, INC., East Windsor, CT (US);

Attorney:

HoustonHogle LLP

Primary Examiner:

Jonathan M Dunlap

Int. Cl.
CPC ...
G01N 30/74 (2006.01); G01N 30/20 (2006.01); G01N 30/88 (2006.01); G01N 30/02 (2006.01); G01N 30/06 (2006.01); G01N 30/30 (2006.01); G01N 30/38 (2006.01); G01N 30/08 (2006.01);
U.S. Cl.
CPC ...
G01N 30/74 (2013.01); G01N 30/06 (2013.01); G01N 30/20 (2013.01); G01N 30/30 (2013.01); G01N 30/38 (2013.01); G01N 2030/025 (2013.01); G01N 2030/085 (2013.01); G01N 2030/201 (2013.01); G01N 2030/202 (2013.01); G01N 2030/743 (2013.01); G01N 2030/8886 (2013.01);
Abstract

A system and method are disclosed for analyzing samples, which includes a spectrometry system for detecting components of a sample; a gas chromatography column for separating the components of a sample; a first sample unit for receiving a first sample from a sample source; and a second sample unit for receiving a second sample from a sample source. Each sample loop unit allows independent processing of samples in preparation for analysis.

Find Patent Forward Citations

Spartz, Martin. (2022). Coupled analytical instruments for dual mode ftir/gc-ftir (U.S. Patent No. 11454618). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11454618

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…