The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2022

Filed:

Mar. 04, 2022
Applicant:

Smartinside Ai Inc., Suwon-si, KR;

Inventors:

Seung Hee Park, Seongnam-si, KR;

Han Sun Kim, Miryang-si, KR;

Assignee:

SMARTINSIDE AI Inc., Suwon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/83 (2006.01); G01R 33/02 (2006.01);
U.S. Cl.
CPC ...
G01N 27/83 (2013.01); G01R 33/02 (2013.01);
Abstract

Disclosed herein is a system for inspecting equipment and materials for quality. The system for inspecting equipment and materials for quality includes: a magnetic sensor configured to generate a magnetic field in an inspection target object, and to detect magnetic flux density; and a quality inspection server configured to determine the presence of a defect, a portion where the detect is present, and the type of defect for the inspection target object based on magnetic flux density waveforms over a range from one end of the inspection target object to the other end thereof that are generated via signals detected by the magnetic sensor.


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