The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2022
Filed:
Jun. 20, 2019
Applicant:
Lumus Ltd., Ness Ziona, IL;
Inventors:
Assignee:
LUMUS LTD., Ness Ziona, IL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/45 (2006.01); G01J 9/02 (2006.01); G01M 11/02 (2006.01); G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/45 (2013.01); G01J 9/0215 (2013.01); G01M 11/0228 (2013.01); G01M 11/37 (2013.01);
Abstract
A system and method for measuring refractive index inhomogeneity between plates of a Lightguide Optical Element (LOE) uses an innovative measuring technique based on a shearing interferometric technique conventionally used to observe interference and test the collimation of light beams. Another feature of the current implementation is an innovative method for analyzing the characteristics of the generated interferogram to characterize discrepancies between adjacent plates in an LOE.