The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2022
Filed:
Apr. 01, 2019
Applicant:
General Electric Company, Schenectady, NY (US);
Inventors:
Louis Lefebvre, Valcourt, CA;
Chinedu Francis Dibia, Waterloo, CA;
Assignee:
General Electric Company, Schenectady, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B33Y 50/02 (2015.01); B29C 64/393 (2017.01); G01B 7/16 (2006.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 70/00 (2020.01); B29C 64/20 (2017.01); B33Y 80/00 (2015.01); B29C 64/112 (2017.01); G06F 30/20 (2020.01); B29L 31/00 (2006.01); B29K 505/00 (2006.01);
U.S. Cl.
CPC ...
G01B 7/20 (2013.01); B29C 64/112 (2017.08); B29C 64/20 (2017.08); B29C 64/393 (2017.08); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); B33Y 70/00 (2014.12); B33Y 80/00 (2014.12); G06F 30/20 (2020.01); B29K 2505/00 (2013.01); B29L 2031/752 (2013.01);
Abstract
A method for measuring strain of a component includes determining a preferred placement for a strain sensor on the component, and a preferred feature dimension and orientation for the strain sensor at the preferred placement on the component; and printing the strain sensor at the preferred placement on the component with the preferred feature dimension and orientation.