The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2022

Filed:

Sep. 26, 2019
Applicant:

Daikin Industries, Ltd., Osaka, JP;

Inventor:

Kiichirou Satou, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
F25D 29/00 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
F25D 29/003 (2013.01); G05B 23/0283 (2013.01); F25D 2500/04 (2013.01); G05B 23/0221 (2013.01);
Abstract

An abnormality determination device for a transporting refrigeration apparatus includes a determination unit that determines an abnormality of the transporting refrigeration apparatus installed on a container. In pre-trip inspection that is conducted before the container is loaded on a transporting device, a test operation is performed for test operating modes. The pre-trip inspection is conducted multiple times. The abnormality determination device is configured to obtain at least part of time series test data related to a same one of the test operating modes in the pre-trip inspection. The determination unit is configured to determine whether the transporting refrigeration apparatus has an abnormality based on a change trend of the time series test data related to a same one of the test operating modes when the pre-trip inspection is conducted multiple times, and when there is no abnormality, estimate an abnormality occurrence time.


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