The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2022
Filed:
Dec. 23, 2020
Qcify Inc., San Mateo, CA (US);
Raf Peeters, San Mateo, CA (US);
Pieter Boogaerts, Sint-Katelijne-Waver, BE;
Joachim Van der Perre, Houthalen, BE;
Bert Switten, Sacramento, CA (US);
Qcify Inc., San Mateo, CA (US);
Abstract
A sub stream auto sampling system includes an inspection unit and a sorter unit. The inspection unit includes a camera configured to capture an image of a sample, a light configured to illuminate a sample, a processor configured to process the captured image, and a memory configured to store the captured image. The sorter unit is configured to divert a sub stream of samples, from a main stream of samples, toward the inspection unit. The output of the inspection unit may be directed to the main stream of samples, or the output of the inspection unit may be directed to a collection unit. In addition to the inspection performed by the inspection unit, weighing of the sub stream of samples may also be performed by a weighing unit before the sub stream of samples are routed to the main stream of samples or the collection unit.