The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2022
Filed:
Sep. 12, 2019
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Yohei Sato, Yokohama, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/217 (2011.01); H04N 1/00 (2006.01); H04N 5/225 (2006.01); B08B 1/00 (2006.01); B08B 5/02 (2006.01); G03B 17/56 (2021.01); G05B 11/00 (2006.01); G05B 19/00 (2006.01);
U.S. Cl.
CPC ...
H04N 5/2171 (2013.01); B08B 1/006 (2013.01); B08B 1/008 (2013.01); B08B 5/02 (2013.01); G05B 11/00 (2013.01); G05B 19/00 (2013.01); H04N 1/00909 (2013.01); H04N 5/2257 (2013.01); H04N 5/22521 (2018.08); G03B 17/56 (2013.01);
Abstract
A cleaning apparatus that includes a cleaning member and cleans a detection surface of a detection element included in a detection device includes a fixing unit configured to fix the detection device attached to the cleaning apparatus, an adjustment mechanism configured to adjust a position of the detection device with respect to the cleaning apparatus and a measurement unit configured to measure a position and an inclination of the detection element of the detection device.