The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2022

Filed:

Jan. 25, 2021
Applicant:

Realtek Semiconductor Corporation, Hsinchu, TW;

Inventors:

De-Pin Zheng, Suzhou, CN;

Dong Qiu, Suzhou, CN;

Xiang-Hua Shen, Suzhou, CN;

Fei Yan, Suzhou, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/38 (2006.01); G06F 13/16 (2006.01);
U.S. Cl.
CPC ...
G11C 29/38 (2013.01); G06F 13/1668 (2013.01); G06F 2213/0016 (2013.01);
Abstract

A method of testing a slave device of an Inter-Integrated Circuit (IC) bus is provided. The method includes the following steps: (A) starting a first read operation or a first write operation of the slave device, the first read operation or the first write operation including a sub-operation of sending a command, an acknowledgement signal, data, an address or a control byte to the slave device; (B) sending a start command or an end command to the slave device after or during the sub-operation; (C) after step (B), performing a second read operation or a second write operation on the slave device; and (D) after step (C), determining whether the second read operation or the second write operation is correctly performed.


Find Patent Forward Citations

Loading…