The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2022

Filed:

Mar. 27, 2019
Applicant:

Boe Technology Group Co., Ltd., Beijing, CN;

Inventors:

Dongxu Han, Beijing, CN;

Tieshi Wang, Beijing, CN;

Zhongyuan Wu, Beijing, CN;

Yongqian Li, Beijing, CN;

Pan Xu, Beijing, CN;

Jinxia Hu, Beijing, CN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/3225 (2016.01);
U.S. Cl.
CPC ...
G09G 3/3225 (2013.01); G09G 2310/027 (2013.01); G09G 2320/0233 (2013.01); G09G 2360/16 (2013.01);
Abstract

Brightness compensation method and apparatus for pixel point are provided. The compensation method includes measurement processes of N times, N≥2. Each measurement process includes: obtaining images displayed on the display screen under different gray-scale signals, and extracting brightness of pixel points in the images; calculating difference parameters between brightness of the pixel points and brightness of the reference pixel point under the different gray-scale signals; fitting the difference parameters of the pixel points with initial brightness of the pixel points under the different gray-scale signals, to obtain initial brightness-difference parameter curves of the pixel points; calculating compensation parameters of the pixel points; during an (i)measurement process, i=2 to N, images displayed on the display screen under the different gray-scale signals are obtained by compensating the initial brightness of the pixel points under the different gray-scale signals based on the compensation parameters obtained during an (i−1)measurement process.


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