The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11450119 B1

Date of Patent:

Sep. 20, 2022

Filed:

Sep. 11, 2019

Information acquisition system, control apparatus, information acquisition method, and storage medium

Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Tsugunori Takata, Tokyo, JP;

Hideo Yokoi, Tokyo, JP;

Kota Iwamoto, Tokyo, JP;

Soma Shiraishi, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:

Primary Examiner:

Gregory M Desire

Int. Cl.

CPC ...

G06K 9/00 (2022.01); G06V 20/64 (2022.01); G06V 30/224 (2022.01); G06V 10/22 (2022.01);

U.S. Cl.

CPC ...

G06V 20/64 (2022.01); G06V 10/22 (2022.01); G06V 30/224 (2022.01);

Abstract

Provided is an information acquisition system including: an image capture apparatus including a camera that captures a target object to generate an image; and a control apparatus including a control unit that controls the image capture apparatus so that a plurality of images in accordance with a plurality of different environment conditions are generated and an information acquisition unit that acquires target object information input to a discriminator that identifies an object, in which the target object information includes the plurality of images or a plurality of feature amounts obtained from the plurality of images.

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