The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2022
Filed:
Sep. 30, 2019
Amazon Technologies, Inc., Seattle, WA (US);
Andrea Olgiati, Gilroy, CA (US);
Maximiliano Maccanti, Bellevue, WA (US);
Arun Babu Nagarajan, Redmond, WA (US);
Lakshmi Naarayanan Ramakrishnan, Redmond, WA (US);
Urvashi Chowdhary, Seattle, WA (US);
Gowda Dayananda Anjaneyapura Range, Redmond, WA (US);
Zohar Karnin, Hoboken, NJ (US);
Laurence Louis Eric Rouesnel, New York, NY (US);
Stefano Stefani, Issaquah, WA (US);
Vladimir Zhukov, Seattle, WA (US);
Amazon Technologies, Inc., Seattle, WA (US);
Abstract
Methods, systems, and computer-readable media for automated problem detection for machine learning models are disclosed. A machine learning analysis system receives data associated with use of a machine learning model. The data was collected by a machine learning inference system and comprises input to the model or a plurality of inferences representing output of the machine learning model. The machine learning analysis system performs analysis of the data associated with the use of the machine learning model. The machine learning analysis system detects one or more problems associated with the use of the machine learning model based at least in part on the analysis. The machine learning analysis system initiates one or more remedial actions associated with the one or more problems associated with the use of the machine learning model.