The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2022

Filed:

Jan. 30, 2020
Applicant:

Micro Focus Llc, Santa Clara, CA (US);

Inventors:

Adarsh Suparna, Bangalore, IN;

Hemant Kumar C H, Bangalore, IN;

Pramod Annachira Vitala, Bangalore, IN;

Assignee:

MICRO FOCUS LCC, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); G06N 5/04 (2006.01); H04L 41/12 (2022.01); H04L 67/10 (2022.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G06N 20/00 (2019.01); H04L 41/12 (2013.01); H04L 67/10 (2013.01);
Abstract

According to examples, an apparatus may include a processor that may generate a migration assessment for resources of a computer system. In particular, the apparatus may logically divide topological information to facilitate identification of a resource, components used by the resource, and dependencies. The system further enables users to specify user-defined migration parameters that specify the migration. For instance, the parameters may specify a cost associated with the migration of the component, a license model of the component, a security requirement of the component, a performance of the component, a customization of the component, or requirement of the component. Migration assessments and decisions may be stored to train machine-learned models. For instance, the model may assess whether a parameter will be satisfied by using a certain cloud service and whether substitutes have sufficiently satisfied dependencies based on observed migration assessments and actual migrations.


Find Patent Forward Citations

Suparna, Adarsh. (2022). Topology-based migration assessment (U.S. Patent No. 11449776). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11449776

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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