The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2022
Filed:
May. 16, 2018
Sightline Innovation Inc., Toronto, CA;
Wallace Trenholm, Toronto, CA;
Mark Alexiuk, Winnipeg, CA;
Hieu Dang, Winnipeg, CA;
Siavash Malektaji, Winnipeg, CA;
Kamal Darchinimaragheh, Winnipeg, CA;
Other;
Abstract
A system and method for non-destructive optical coherence tomography (OCT) is provided. The system includes: an input interface for receiving OCT data including at least a C-scan; a processing unit executable to detect a feature on a surface or subsurface of the object, trained using a training set and configured to: separate the C-scan into A-scans; using a neural network, successively analyze each A-scan to detect the presence of an A-scan feature associated with the object; separate the C-scan into B-scans; segment each of the B-scans to determine thresholds associated with the object; using a neural network, successively analyze each segmented B-scan to detect the presence of an B-scan feature associated with the object; convert the C-scan to one or more two-dimensional representations; and using a neural network, detect the presence of an C-scan feature associated with the object.