The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2022
Filed:
Dec. 06, 2019
Industry Academy Cooperation Foundation of Sejong University, Seoul, KR;
Kee-sun Sohn, Seoul, KR;
Jin-woong Lee, Busan, KR;
Abstract
A method of identifying and analyzing materials includes selecting at least two elements, collecting data of a plurality of compounds analyzed to be producible by the at least two elements, preparing image or spectrum-type analysis data for each of the plurality of collected compounds, selecting binary or higher-order compounds from among the plurality of compounds to mix the selected compounds at a predetermined mixing ratio, and generating training data including resultant data obtained by combining and processing the image or spectrum-type analysis data according to the predetermined mixing ratio, performing machine learning using the training data, and identifying and/or analyzing image or spectrum-type analysis data obtained from an actual material, using a model obtained through the machine learning.