The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2022
Filed:
Jan. 22, 2021
Applicant:
Salesforce.com, Inc., San Francisco, CA (US);
Inventors:
Sahibdeep Singh, San Francisco, CA (US);
Linda Wei, San Francisco, CA (US);
Ahmet Bugdayci, Los Altos, CA (US);
Mario Sergio Rodriguez, Santa Clara, CA (US);
Assignee:
Salesforce.com, Inc., San Francisco, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/24 (2006.01); G06F 11/34 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3476 (2013.01); G06F 11/3006 (2013.01); G06F 11/3409 (2013.01); G06F 11/3452 (2013.01);
Abstract
Systems and methods are described for generating metrics from log data items, automatically inferring one or more schemas based at least in part on analyzing samples of the log data items, validating samples of the log data items against the one or more schemas to detect log data item errors, and analyzing the log data item errors according to metrics analytics rules to determine an effect of the log data item errors on a quality measurement of the metrics.