The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2022
Filed:
Jul. 30, 2019
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Mikhail Danilov, Saint Petersburg, RU;
Yohannes Altaye, Dumfries, VA (US);
EMC IP HOLDING COMPANY LLC, Hopkinton, MA (US);
Abstract
Mitigating the effects of a real node failure in a doubly mapped redundant array of independent nodes, e.g., doubly mapped cluster is disclosed. In response to a change in an accessibility to data stored on an extent of a real storage device of a real node of a real cluster, wherein the extent of the real storage device corresponds to a portion of a mapped storage device of a mapped node of a doubly mapped cluster, substituting a reserved extent of a real storage device for the extent of the real storage device. The substituting the reserved extent of the real storage device can correspond to a change in a topology of the doubly mapped cluster, wherein the change in the topology comprises replacing the portion of the mapped storage device with a substitute portion of a mapped storage device that corresponds to the replacement extent of the real storage device. The changed topology can enable writing of data to the substituted portion of a mapped storage device that can cause writing of corresponding data to the reserved extent of the real storage device.