The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2022
Filed:
Jun. 01, 2017
Honeywell Limited, Mississauga, CA;
Qiugang Lu, Vancouver, CA;
R. Bhushan Gopaluni, Vancouver, CA;
Michael G. Forbes, North Vancouver, CA;
Philip D. Loewen, North Vancouver, CA;
Johan U. Backstrom, North Vancouver, CA;
Guy A. Dumont, Vancouver, CA;
Honeywell Limited, Ontario, CA;
Abstract
A method includes obtaining operating data associated with operation of a cross-directional industrial process controlled by at least one model-based process controller. The method also includes, during a training period, performing closed-loop model identification with a first portion of the operating data to identify multiple sets of first spatial and temporal models. The method further includes identifying clusters associated with parameter values of the first spatial and temporal models. The method also includes, during a testing period, performing closed-loop model identification with a second portion of the operating data to identify second spatial and temporal models. The method further includes determining whether at least one parameter value of at least one of the second spatial and temporal models falls outside at least one of the clusters. In addition, the method includes, in response to such a determination, detecting that a mismatch exists between actual and modeled behaviors of the industrial process.