The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2022
Filed:
Apr. 02, 2020
Samsung Electronics Co., Ltd., Suwon-si, KR;
Seoul National University (Snu) R&db Foundation, Seoul, KR;
Deokyoung Kang, Suwon-si, KR;
Myung Joo Kang, Seoul, KR;
Yang Ho Cho, Seongnam-si, KR;
Seung Won Jeong, Seoul, KR;
Jin Je Park, Seoul, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
SNU R&DB FOUNDATION, Seoul, KR;
Abstract
An aberration correction method and apparatus. The apparatus includes at least one processor, and an input/output unit configured to receive an captured image, wherein the processor is configured to initialize a first matrix or a second matrix by reducing a matrix of a point spread function (PSF) of a lens included in a capturing device used to capture the captured image, iteratively perform an aberration removal and a noise removal based on the captured image and the first matrix or the second matrix, and output a final original image as a result of the iteratively performing. Here, the first matrix is a matrix obtained by reducing the number of indices indicating light arrival points of the matrix of the PSF, and the second matrix is a matrix obtained by reducing the number of indices corresponding to light arrival points of a transposed matrix of the PSF.