The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2022

Filed:

Dec. 17, 2018
Applicant:

Lg Chem, Ltd., Seoul, KR;

Inventors:

Jin Young Son, Daejeon, KR;

Moo Yong Shin, Daejeon, KR;

Taek Soo Lee, Daejeon, KR;

Cheol Woo Kim, Daejeon, KR;

Sang Hoon Choy, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/57 (2006.01); H01M 4/04 (2006.01); G01N 21/35 (2014.01); G01N 21/47 (2006.01); G01N 21/65 (2006.01); G01N 21/3554 (2014.01); G01N 21/25 (2006.01); H01M 4/88 (2006.01); G01N 15/14 (2006.01);
U.S. Cl.
CPC ...
G01N 21/57 (2013.01); H01M 4/0404 (2013.01); G01N 15/14 (2013.01); G01N 21/25 (2013.01); G01N 21/35 (2013.01); G01N 21/3554 (2013.01); G01N 21/47 (2013.01); G01N 21/65 (2013.01); H01M 4/8882 (2013.01);
Abstract

The present invention relates to an apparatus and method for monitoring a dry state of an electrode substrate in which electrode slurry is applied to a collector. The monitoring method comprises emitting light onto a surface of the electrode substrate; receiving the light reflected by the surface of the electrode substrate; and analyzing a luminous intensity or spectrum of the received light to estimate a drying rate of the electrode substrate. The apparatus includes a light emitting part emitting light from a light source onto a surface of the electrode substrate; a light receiving part receiving the light reflected by the surface of the electrode substrate; and a computing device analyzing a luminous intensity or spectrum of the received light and comparing analyzed characteristics of the light with the reference data of the reflected light to the drying rate of the electrode substrate.


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