The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2022
Filed:
Aug. 01, 2018
Applicant:
Horiba, Ltd., Kyoto, JP;
Inventors:
Yoshitake Ando, Kyoto, JP;
Masayuki Adachi, Kyoto, JP;
Assignee:
HORIBA, LTD., Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/3504 (2014.01); G01N 21/35 (2014.01);
U.S. Cl.
CPC ...
G01N 21/3504 (2013.01); G01N 2021/3595 (2013.01); G01N 2201/1293 (2013.01);
Abstract
An analyzer that analyzes a measurement sample on the basis of spectrum data obtained by irradiating the measurement sample with light and includes a total analysis value calculation part that, on the basis of the total analysis value of a reference sample of which the total analysis value of multiple predetermined components are preliminarily obtained, calculates the total analysis value of the multiple components in the measurement sample from the spectrum data of the measurement sample.
Ando, Yoshitake. (2022). Analyzer, analysis method, analyzer program, and analysis learning device (U.S. Patent No. 11448588). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11448588
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile