The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2022

Filed:

Jun. 10, 2016
Applicant:

Sony Group Corporation, Tokyo, JP;

Inventors:

Masatoshi Takashima, Tokyo, JP;

Yoshihiro Murakami, Kanagawa, JP;

Hiroshi Mori, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/25 (2006.01); A01G 7/00 (2006.01); G01N 21/27 (2006.01); G01J 3/28 (2006.01); G01J 1/42 (2006.01); G01J 3/02 (2006.01); G01J 3/42 (2006.01); G01N 33/00 (2006.01); G01N 21/84 (2006.01); G01J 3/18 (2006.01);
U.S. Cl.
CPC ...
G01N 21/255 (2013.01); A01G 7/00 (2013.01); G01J 1/4204 (2013.01); G01J 3/0208 (2013.01); G01J 3/0224 (2013.01); G01J 3/2803 (2013.01); G01J 3/42 (2013.01); G01N 21/27 (2013.01); G01N 21/274 (2013.01); G01N 33/0098 (2013.01); G01J 3/18 (2013.01); G01J 2003/2806 (2013.01); G01J 2003/425 (2013.01); G01N 2021/8466 (2013.01); G01N 2201/0616 (2013.01);
Abstract

The present disclosure relates to an inspection apparatus, a sensing apparatus, a sensitivity control apparatus, an inspection method, and a program that perform inspection with improved accuracy. The inspection apparatus includes a detection section for detecting a plurality of different wavelength region components of ambient light reflected from an inspection target to be inspected, and a control section for controlling the sensitivity of each of the different wavelength region components. The control section controls the sensitivity by calculating a histogram indicating the detection level in every wavelength region of light reflected from the inspection target that is detected by the detection section, and determining, based on histograms of particular spectroscopic components, whether or not the sensitivity is properly set for the detection section. The present technology is applicable, for example, to an inspection apparatus that inspects vegetation.


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