The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2022

Filed:

Jun. 11, 2020
Applicant:

Commissariat À I'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventors:

Arnaud Verdant, Grenoble, FR;

William Guicquero, Grenoble, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/17 (2006.01); G01N 21/47 (2006.01); G02F 1/11 (2006.01); G02F 2/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/1717 (2013.01); G01N 21/4788 (2013.01); G02F 1/11 (2013.01); G02F 2/00 (2013.01); G01N 2021/479 (2013.01);
Abstract

The present invention relates to an imaging system, including: a coherent light source delivering an object beam and a reference beam; a device of modulation of the object beam with a modulation signal; an image sensor arranged to receive an interference pattern resulting from a combination of the object beam and of the reference beam; and a demodulation device, the system being configured to, during a measurement phase: apply to the modulation signal a first pseudo-random sequence of jumps of a parameter selected among the phase, the frequency, and the amplitude; and simultaneously apply to the modulated portion of the object beam a second pseudo-random sequence of jumps of said parameter, wherein the first and second sequences of jumps of said parameter are non-correlated.


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