The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2022

Filed:

Jun. 04, 2019
Applicants:

Palo Alto Research Center Incorporated, Palo Alto, CA (US);

Panasonic Corporation, Kadoma, JP;

Inventors:

Deokwoo Jung, Mountain View, CA (US);

Fangzhou Cheng, Mountain View, CA (US);

Ajay Raghavan, Mountain View, CA (US);

Yukinori Sasaki, Hyogo, JP;

Akira Minegishi, Osaka, JP;

Tetsuyoshi Ogura, Osaka, JP;

Yosuke Tajika, Hyogo, JP;

Assignees:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01M 99/00 (2011.01);
U.S. Cl.
CPC ...
G01M 99/005 (2013.01);
Abstract

One embodiment can provide a system for detecting anomaly for high-dimensional sensor data associated with one or more machines. During operation, the system can obtain sensor data from a set of sensor associated with one or machines, apply data exploration techniques on the sensor data to automatically process sensor data to identify a subset of feature sensors from the available set of feature sensors, apply an unsupervised machine-learning technique to the identified subset of feature sensors and the target sensor to learn a set of pair-wise univariate models, and determine whether and how an anomaly occurs in the operation of the one or more machines based on the set of pair-wise univariate models.


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