The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2022
Filed:
Jan. 20, 2021
Samsung Display Co., Ltd., Yongin-si, KR;
Dae Youn Cho, Yongin-si, KR;
Eu Gene Kim, Seongnam-si, KR;
Ji Ho Moon, Hwaseong-si, KR;
Jong Woo Park, Seongnam-si, KR;
Young Tae Choi, Cheonan-si, KR;
SAMSUNG DISPLAY CO., LTD., Gyeonggi-Do, KR;
Abstract
An optical measurement device includes an optical sensor which measures an optical waveform of a reference object or a measurement object, a learner which receives a first optical waveform of the reference object from the optical sensor and learns frequency characteristics of the first optical waveform, a filter generator which analyzes the frequency characteristics of the first optical waveform and generates a frequency filter, a frequency modeling unit which receives a second optical waveform of the measurement object from the optical sensor and models frequency characteristics of the second optical waveform, and an optical characteristic detector which calculates an optical characteristic index of the second optical waveform based on an output value of the frequency modeling unit and the frequency filter.