The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2022
Filed:
Jan. 17, 2020
Applicant:
Phiar Technologies, Inc., Redwood City, CA (US);
Inventors:
Chen-Ping Yu, Santa Clara, CA (US);
Xinyu Li, Jersey City, NY (US);
Aaditya Chandrasekhar, San Francisco, CA (US);
Assignee:
Other;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01C 21/36 (2006.01); G01C 21/34 (2006.01); G06T 11/60 (2006.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
G01C 21/3647 (2013.01); G01C 21/3415 (2013.01); G01C 21/365 (2013.01); G01C 21/3691 (2013.01); G06T 7/11 (2017.01); G06T 11/60 (2013.01); G06T 2207/30252 (2013.01);
Abstract
A system and method may generate a more realistic augmented reality (AR) overlay by generating a segmentation image and blending it with one or more other images. The system may generate a segmentation image based on an input image. The segmentation image may be blended with an AR path overlay image to generate an object-masked AR path overlay image. The object-masked AR path overlay image may be blended with the input image to generate an output image.