The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2022

Filed:

Jul. 01, 2020
Applicant:

Keyence Corporation, Osaka, JP;

Inventor:

Kazuki Natori, Osaka, JP;

Assignee:

KEYENCE CORPORATION, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); G02B 26/08 (2006.01); G01N 21/88 (2006.01); G01B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2513 (2013.01); G01B 5/0004 (2013.01); G01B 11/2527 (2013.01); G01B 11/2531 (2013.01); G01N 21/8806 (2013.01); G02B 26/0833 (2013.01);
Abstract

A three-dimensional shape measuring apparatus includes a fixer that fixes an illuminator and a photoreceptor to produce a measurement area to be illuminated with measuring light above a stage and to incline their optical axes with respect to a placement surface of the stage in an orientation in which the illuminator and the photoreceptor face the measurement area obliquely downward; a point cloud data generator that generates point cloud data as a set of points including three-dimensional position information representing a three-dimensional shape of a measurement object placed on the stage based on light-reception signals provided by the photoreceptor; a top view map image generator that generates a top view map image representing a plan view of the measurement object as viewed downward from a position right above the measurement object based on the point cloud data; and a display that displays the top view map image.


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