The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2022
Filed:
Oct. 04, 2018
Applicant:
Ihi Corporation, Tokyo, JP;
Inventor:
Riku Shimizu, Tokyo, JP;
Assignee:
IHI CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); B29C 64/153 (2017.01); B29C 64/393 (2017.01); B22F 12/00 (2021.01); B22F 10/10 (2021.01);
U.S. Cl.
CPC ...
B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B22F 10/10 (2021.01); B22F 12/00 (2021.01); B22F 2998/10 (2013.01); B22F 2999/00 (2013.01); B29C 64/153 (2017.08); B29C 64/393 (2017.08); B33Y 50/02 (2014.12);
Abstract
An additive manufacturing device is provided with a beam irradiation unit irradiating a conductive powder disposed in a layered shape with a beam, a nondestructive inspection unit detecting a flaw in a surface layer of an additively manufactured article formed of the hardened conductive powder, and an energy control unit controlling energy of the beam. The energy control unit increases energy of a beam when a repairing region set in accordance with results of flaw detection by the nondestructive inspection unit is irradiated with the beam.