The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2022
Filed:
Dec. 13, 2018
Applicant:
Umicore Shokubai Japan Co., Ltd., Aichi, JP;
Inventors:
Assignee:
UMICORE SHOKUBAI JAPAN CO., LTD, Aichi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01J 21/04 (2006.01); B01J 21/06 (2006.01); B01J 23/10 (2006.01); B01J 23/63 (2006.01); B01J 35/00 (2006.01); C01B 3/16 (2006.01); F01N 3/10 (2006.01); F01N 3/28 (2006.01);
U.S. Cl.
CPC ...
B01J 23/63 (2013.01); B01J 35/0006 (2013.01); B01J 35/006 (2013.01); C01B 3/16 (2013.01); F01N 3/101 (2013.01); F01N 3/2803 (2013.01); C01B 2203/1064 (2013.01); F01N 2370/02 (2013.01); F01N 2510/0684 (2013.01);
Abstract
An object of the present invention is to provide means for improving the hydrogen generation properties of a hydrogen-producing catalyst. A hydrogen-producing catalyst according to one aspect of the present invention comprises Rh and a composite containing Al, Ce, and Zr. When a ratio of the number of Al atoms to the number of Ce atoms (Al/Ce) in the composite measured by X-ray fluorescence (XRF) analysis is Rand a ratio of the number of Al atoms to the number of Ce atoms (Al/Ce) in the composite measured by an X-ray photoelectron spectroscopy (XPS) method is R, a value of R/Ris greater than 2.25 and less than 5.92.