The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2022

Filed:

Apr. 24, 2020
Applicant:

Huawei Technologies Co., Ltd., Guangdong, CN;

Inventors:

Peng Guan, Chengdu, CN;

Xi Zhang, Kanata, CA;

Min Zhang, Shenzhen, CN;

Hongzhe Shi, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); H04J 3/14 (2006.01); H04L 1/00 (2006.01); H04W 24/08 (2009.01); H04L 5/00 (2006.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); H04L 5/0048 (2013.01);
Abstract

This disclosure relates to a communication method and apparatus. The method includes: receiving, by a terminal device, a reference signal sent by a network device; measuring the reference signal to obtain at least one piece of beam quality; and reporting specified differential beam quality indication information to the network device, where the specified differential beam quality indication information is used to indicate that beam quality reporting is abnormal, and/or the specified differential beam quality indication information is used to indicate that beam quality corresponding to the specified differential beam quality indication information is a specified value. A corresponding apparatus is further disclosed. According to the solution in this disclosure, specified differential beam quality indication information is used to indicate that beam quality reporting is abnormal or indicate that beam quality is a specified value, so that beam quality can be accurately reported.


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