The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2022
Filed:
Oct. 26, 2020
Mettler-toledo (Changzhou) Precision Instruments Co., Ltd., Changzhou, CN;
Mettler-toledo (Changzhou) Measurement Technology Co., Ltd., Changzhou, CN;
Mettler-toledo International Trading (Shanghai) Co., Ltd., Shanghai, CN;
Dake Tan, Changzhou, CN;
Lifeng Cai, Changzhou, CN;
Mettler-Toledo (Changzhou) Precision Instruments Co., Ltd., Changzhou, CN;
Mettler-Toledo (Changzhou) Measurement Technology Co., Ltd., Changzhou, CN;
Mettler-Toledo International Trading (Shanghai) Co., Ltd., Shanghai, CN;
Abstract
A dynamic weighing device has a plurality of weighing sensors that constitute a weighing sensor network via Ethernet. One of the weighing sensors is selected as a primary node, which performs time synchronization with the other nodes via a time synchronization protocol. Alternatively, the other nodes synchronize a time offset relative to the time of the primary node. Each weighing sensor continuously packetizes and sends a plurality of consecutive pieces of weighing information to a terminal apparatus. The terminal apparatus calculates a weighed weight result of the dynamic weighing device at the same moment, based on time information in the weighing information obtained through depacketization, In such a weighing sensor network, by means of the time synchronization, weighing data at each moment is accurate when the weighing data is processed on a terminal such as a meter, thereby improving the reliability of sampling.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile