The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2022

Filed:

Oct. 20, 2020
Applicant:

Aptiv Technologies Limited, St. Michael, BB;

Inventors:

James R. Cook, Poland, OH (US);

Nicolas A. Carbone, Cortland, OH (US);

Assignee:

APTIV TECHNOLOGIES LIMITED, St. Michael, BB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02J 50/60 (2016.01); H02J 50/10 (2016.01); H02J 50/40 (2016.01); H02J 7/06 (2006.01); H02J 50/90 (2016.01);
U.S. Cl.
CPC ...
H02J 50/60 (2016.02); H02J 7/06 (2013.01); H02J 50/10 (2016.02); H02J 50/402 (2020.01); H02J 50/90 (2016.02);
Abstract

Inductive charging systems and methods detect a wireless device upon a charging surface of a wireless charging pad including a transmitter coil, determine a first quality factor of the transmitter coil and initiate a charging session, and during the charging session, periodically perform a foreign object detection (FOD) technique including adjusting an operating point of the transmitter coil according to a specific sequence of operating points that causes rectifier diodes between the receiver coil and a receiver load of the wireless device to be reverse biased to disconnect the receiver load from the receiver coil and then determining a second quality factor of the transmitter coil, and detecting whether a foreign object is present on the charging surface based on a comparison between the first and second quality factors.


Find Patent Forward Citations

Cook, James. (2022). Techniques for detecting the presence of a foreign object on the surface of a wireless charging transmitter by measuring quality factor during a charging session (U.S. Patent No. 11444493). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11444493

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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