The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2022

Filed:

Nov. 23, 2020
Applicant:

Agilent Technologies, Inc., Santa Clara, CA (US);

Inventor:

Noriyuki Yamada, Tokyo, JP;

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/10 (2006.01); H01J 49/02 (2006.01); H01J 49/06 (2006.01); H01J 49/00 (2006.01); H01J 49/04 (2006.01);
U.S. Cl.
CPC ...
H01J 49/105 (2013.01); H01J 49/004 (2013.01); H01J 49/022 (2013.01); H01J 49/063 (2013.01); H01J 49/0459 (2013.01);
Abstract

An inductively coupled plasma-mass spectrometry (ICP-MS) system includes an ion trap, in which ions are trapped and subsequent ejected by mass-selective ejection (MSE). The system may have a linear quadrupole configuration, in which the ion trap is a linear ion trap (LIT) that is preceded by a pre-LIT linear quadrupole device and/or a post-LIT quadrupole device. The pre-LIT and/or post-LIT quadrupole device may be configured or operated as an RF-only ion guide or as a mass filter or mass analyzer, with or without mass scanning. The system may be utilized in particular for multi-element analysis of fast transient signals produced from ion pulses, where the sample under analysis is a single particle, single biological cell, or a cloud or aerosol produced for example by single-shot laser ablation.


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