The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2022
Filed:
Jun. 11, 2020
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventors:
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/44 (2022.01); G06K 9/62 (2022.01); G06V 10/42 (2022.01);
U.S. Cl.
CPC ...
G06V 10/454 (2022.01); G06K 9/6271 (2013.01); G06V 10/431 (2022.01);
Abstract
A method for analyzing images to generate a plurality of output features includes receiving input features of the image and performing Fourier transforms on each input feature. Kernels having coefficients of a plurality of trained features are received and on-the-fly Fourier transforms (OTF-FTs) are performed on the coefficients in the kernels. The output of each Fourier transform and each OTF-FT are multiplied together to generate a plurality of products and each of the products are added to produce one sum for each output feature. Two-dimensional inverse Fourier transforms are performed on each sum.