The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2022

Filed:

Mar. 26, 2020
Applicant:

Shenzhen Sensetime Technology Co., Ltd., Shenzhen, CN;

Inventors:

Yukang Gan, Shenzhen, CN;

Xiangyu Xu, Shenzhen, CN;

Wenxiu Sun, Shenzhen, CN;

Liang Lin, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/50 (2017.01); G06N 3/04 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G06T 7/50 (2017.01); G06N 3/0454 (2013.01); G06N 3/08 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

A method and apparatus for depth estimation of a monocular image, and a storage medium are provided. The method includes: obtaining, through a depth estimation neural network, a global feature of a monocular image according to absolute features of preset regions and relative features among the preset regions in the monocular image; and obtaining a predicted depth map of the monocular image according to the global feature, and the absolute features of preset regions and relative features among the preset regions in the monocular image.


Find Patent Forward Citations

Gan, Yukang. (2022). Method and apparatus for depth estimation of monocular image, and storage medium (U.S. Patent No. 11443445). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11443445

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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