The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2022

Filed:

Jan. 28, 2020
Applicant:

Here Global B.v., Eindhoven, NL;

Inventors:

Andrew Philip Lewis, Berkeley, CA (US);

Stacey Matthew Mott, Waterville, NY (US);

Assignee:

HERE GLOBAL B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/33 (2017.01); G06T 7/32 (2017.01);
U.S. Cl.
CPC ...
G06T 7/33 (2017.01); G06T 7/32 (2017.01); G06T 2207/30252 (2013.01);
Abstract

A method, apparatus and computer program product are provided to localize data from at least one of two or more data sets a based upon the registration of synthetic images representative of the two or more data sets. In the context of a method, first and second synthetic images are created from first and second data sets, respectively. In creating the first and second synthetic images, representations of one or more features from the first and second data sets are rasterized. The method also determines a transformation based upon a phase correlation between the first and second synthetic images. The transformation provides for improved localization of the data from at least one of the first or second data sets. The method also generates a report that defines the transformation.


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