The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2022
Filed:
Jan. 06, 2021
Olympus Corporation, Tokyo, JP;
Masaru Mizunaka, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
An inspection method for inspecting a counting function of an imaging system that captures an image of a phase object includes: capturing an image of a reference standard plate that includes a base region and a plurality of counting target regions having a phase amount in a thickness direction different from a phase amount of the base region, under a condition where the number of counting target regions positioned within a field of view of the imaging system is specified among the plurality of counting target regions; counting the counting target regions included in the captured image of the reference standard plate; and outputting at least a counted result of the counting target regions.