The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2022

Filed:

Nov. 04, 2020
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Masataka Tanaka, Tokyo, JP;

Yoshio Mitsuishi, Tokyo, JP;

Fumiya Shimizu, Tokyo, JP;

Yuma Shiho, Tokyo, JP;

Naoaki Kawashima, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/06 (2012.01); G06Q 50/04 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/06393 (2013.01); G06Q 50/04 (2013.01);
Abstract

A cause of work loss in a factory that produces high-mix low-volume products is extracted. The analysis system includes: a calculation unit; a storage unit; and an input and output unit. The storage unit stores record information related to operation time of an activity for producing a product, and threshold information for determining whether the activity of producing the product is abnormal based on the operation time. The calculation unit is configured to determine the operation time and non-operation time for each case extracted from the record information, determine abnormality for each case based on the operation time for each case and the threshold information, and output information of comparing the operation time of a case determined to be abnormal with the operation time of a case not determined to be abnormal to the input and output unit.


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