The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2022
Filed:
Dec. 10, 2019
Applicant:
Edward L. Schwartz, Sunnyvale, CA (US);
Inventor:
Edward L. Schwartz, Sunnyvale, CA (US);
Assignee:
RICOH COMPANY, LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2022.01); G06N 3/08 (2006.01); G06N 3/04 (2006.01); G06V 10/98 (2022.01);
U.S. Cl.
CPC ...
G06K 9/623 (2013.01); G06K 9/6259 (2013.01); G06N 3/0454 (2013.01); G06N 3/088 (2013.01); G06V 10/98 (2022.01); G06V 2201/02 (2022.01);
Abstract
A system for analog gauge monitoring uses a machine learning model for computer vision that is trained using synthetic training data generated based on one or a few images of the gauge being monitored and a geometric model describing the scale and the indicator of the gauge. In some embodiments, the synthetic training data is generated using an image model implemented as a generative adversarial network (GAN) type neural network and trained to modify an image of a given gauge such that the gauge face is preserved while the gauge indicator is added to or removed from the image of the given gauge for any given gauge.