The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2022
Filed:
Mar. 10, 2020
International Business Machines Corporation, Armonk, NY (US);
Andrew C. M. Hicks, Wappingers Falls, NY (US);
Ryan Thomas Rawlins, New Paltz, NY (US);
Deborah A. Furman, Staatsburg, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Techniques for runtime metrics based test ordering in a computer system are described herein. An aspect includes determining a first runtime metric associated with a first module based on the execution of a first test case. Another aspect includes determining a second runtime metric associated with a second module based on the execution of a second test case. Another aspect includes comparing the first runtime metric and the second runtime metric. Another aspect includes determining an order of a plurality of test cases based on the comparison of the first runtime metric and the second runtime metric. Another aspect includes executing the plurality of test cases in the determined order.