The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2022

Filed:

May. 31, 2017
Applicant:

Mitsubishi Hitachi Power Systems, Ltd., Kanagawa, JP;

Inventors:

Ichiro Nagano, Yokohama, JP;

Kuniaki Aoyama, Tokyo, JP;

Mayumi Saito, Tokyo, JP;

Shintaro Kumano, Tokyo, JP;

Katsuhiko Abe, Yokohama, JP;

Toru Tanaka, Yokohama, JP;

Takahiro Yamauchi, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/00 (2006.01); G05B 23/02 (2006.01); F01D 25/00 (2006.01); F02C 7/00 (2006.01); F01D 25/08 (2006.01); F02C 7/22 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0248 (2013.01); F01D 25/00 (2013.01); F01D 25/08 (2013.01); F02C 7/00 (2013.01); F02C 7/22 (2013.01); G05B 23/02 (2013.01); G05B 23/0221 (2013.01); G05B 23/0235 (2013.01);
Abstract

An acquisition unit is configured to acquire measurement values of a target device. A likelihood calculation unit is configured to calculate an occurrence likelihood for each of a plurality of phenomena that are liable to occur to the target device based on the measurement values acquired by the acquisition unit. A table storage unit is configured to store a table in which the plurality of phenomena and occurrence causes of abnormalities of the target device are associated to each other. As estimation unit is configured to estimate the occurrence causes based on the occurrence likelihood and the table.


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