The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2022
Filed:
Dec. 28, 2018
Canon Kabushiki Kaisha, Tokyo, JP;
Atsushi Kusaka, Shimotsuke, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
Imprint apparatus forms pattern in shot regions of substrate by bringing pattern region of mold into contact with imprint material and curing the imprint material. The apparatus includes deformation mechanism which is for deforming the pattern region and includes actuator for applying force to the mold. For each shot region, after first processing of applying first deformation amount to the mold by the actuator is executed, second processing of curing the imprint material is executed in state in which the imprint material and the pattern region are in contact with each other and second deformation amount is applied to the mold by the actuator to reduce overlay error between the shot region and the pattern region. Magnitude relationship between the first deformation amount and the second deformation amount is same in the shot regions.