The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2022

Filed:

May. 08, 2019
Applicant:

Hoya Corporation, Tokyo, JP;

Inventors:

Hitoshi Maeda, Tokyo, JP;

Hiroaki Shishido, Tokyo, JP;

Masahiro Hashimoto, Tokyo, JP;

Assignee:

HOYA CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 1/26 (2012.01); H01L 21/033 (2006.01);
U.S. Cl.
CPC ...
G03F 1/26 (2013.01); H01L 21/0332 (2013.01); H01L 21/0337 (2013.01);
Abstract

Provided is a mask blank, including a phase shift film. The phase shift film has a structure where a first layer and a second layer are stacked in this order from a side of the transparent substrate. The first layer is provided in contact with a surface of the transparent substrate. Refractive indexes nand nof the first layer and the second layer, respectively, at a wavelength of an exposure light of an ArF excimer laser satisfy the relation n<n. Extinction coefficients kand kof the first layer and the second layer, respectively, at a wavelength of the exposure light satisfy the relation k<k. Film thicknesses dand dof the first layer and the second layer, respectively, satisfy the relation d<d.


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