The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2022

Filed:

Jun. 17, 2021
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Hendrikus Van Lierop, Bj Weert, NL;

Alexander Hulsker, Nijmegen, NL;

Jaap Verheggen, Wijchen, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01); G01N 21/95 (2006.01); G02B 6/35 (2006.01); G01N 21/55 (2014.01);
U.S. Cl.
CPC ...
G02B 26/0833 (2013.01); G01N 21/55 (2013.01); G01N 21/95 (2013.01); G02B 6/3514 (2013.01); G02B 6/3518 (2013.01); G02B 6/3584 (2013.01);
Abstract

A method of monitoring a microelectromechanical systems (MEMS) oscillating structure includes: driving the MEMS oscillating structure configured to oscillate about a rotation axis according to an operating response curve during which the MEMS oscillating structure is in resonance, wherein the MEMS oscillating structure is a non-linear resonator; inducing an oscillation decay of the MEMS oscillating structure at predefined tilt angle such that an oscillation of the MEMS oscillating structure decays from the predefined tilt angle over a decay period; measuring at least one characteristic of the oscillation decay; and determining a mechanical health of the MEMS oscillating structure based on the at least one characteristic of the oscillation decay.


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