The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2022

Filed:

Nov. 24, 2020
Applicant:

Korea Institute of Science and Technology, Seoul, KR;

Inventors:

Ig Jae Kim, Seoul, KR;

Je Hyeong Hong, Seoul, KR;

Donghoon Kang, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01P 21/00 (2006.01); G01R 33/00 (2006.01); G01L 25/00 (2006.01); G01P 15/18 (2013.01); G01R 33/02 (2006.01);
U.S. Cl.
CPC ...
G01R 33/0041 (2013.01); G01L 25/00 (2013.01); G01P 15/18 (2013.01); G01P 21/00 (2013.01); G01R 33/0094 (2013.01); G01R 33/0206 (2013.01);
Abstract

Embodiments relate to a method including obtaining m measured values for each field sensor by measuring with respect to a first sensor group including first type of field sensors and a second sensor group including different second type of field sensors, which are attached to the rigid body, at m time steps; and calibrating a sensor frame of the first type of field sensor and a sensor frame of the second type of field sensor by using a correlation between the first type of field sensor and the second type of field sensor based on measured values of at least some of the m time steps, wherein the multiple field sensors include different field sensors of a magnetic field sensor, an acceleration sensor, and a force sensor, and a system therefor.


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